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Question

An application, which already uses X-Ray, generates thousands of trace data every hour. The developer wants to use a filter expression which will limit the results based on custom attributes or keys that he specifies. How should the developer refactor the application in order to filter the results in the X-Ray console?
  • Add the custom attributes as annotations in your segment document.
  • Create a new sampling rule based on the custom attributes.
  • Include the custom attributes as new segment fields in the segment document.
  • Add the custom attributes as metadata in your segment document.
Answer- A


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